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Current spinon-holon description of the one-dimensional charge-transfer insulator SrCuO2: Angle-resolved photoemission measurements

机译：目前的一维电荷转移的spinon-holon描述绝缘体srCuO2：角度分辨光电发射测量

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摘要

We have investigated the low-energy electronic structure of the stronglycorrelated one-dimensional copper oxide chain compound SrCuO2 by angle resolvedphotoemission as a function of excitation energy. In addition to the prominentspinon-holon continuum we observe a peaklike and dispersive feature at the zoneboundary. By fine-tuning the experimental parameters we are able to monitor thefull holon branch and to directly measure the electronic hopping parameter withunprecedented accuracy.

机译：我们已经研究了强相关的一维氧化铜链化合物SrCuO2的低能电子结构，其是通过角分辨光发射作为激发能的函数。除了突出的纺锤体-holon连续体，我们还观察到了区域边界处的峰状和分散特征。通过微调实验参数，我们能够监控整个holon分支，并以前所未有的精度直接测量电子跳跃参数。

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Koitzsch, A.; Borisenko, S. V.; Geck, J.; Zabolotnyy, V. B.; Knupfer, M.; Fink, J.; Ribeiro, P.; Buechner, B.; Follath, R.;
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1. Current spinon-holon description of the one-dimensional charge-transfer insulator SrCuO_2: Angle-resolved photoemission measurements [J] . A. Koitzsch, S. V. Borisenko, J. Geck, Physical review. B, Condensed Matter And Materials Physics . 2006,第20期

机译：一维电荷转移绝缘子SrCuO_2的当前自旋-holon描述：角分辨光发射测量
2. Measurement of an Exceptionally Weak Electron-Phonon Coupling on the Surface of the Topological Insulator Bi_2Se_3 Using Angle-Resolved Photoemission Spectroscopy [J] . Z.-H. Pan, A. V. Fedorov, D. Gardner, Physical review letters . 2012,第18期

机译：使用角度分辨光发射光谱法测量拓扑绝缘子Bi_2Se_3表面上异常弱的电子-声子耦合
3. Measurement of Intrinsic Dirac Fermion Cooling on the Surface of the Topological Insulator Bi_2Se_3 Using Time-Resolved and Angle-Resolved Photoemission Spectroscopy [J] . Y.H. Wang, D. Hsieh, E. J. Sie, Physical review letters . 2012,第12期

机译：时间分辨和角度分辨光发射光谱法测量拓扑绝缘子Bi_2Se_3表面的固有狄拉克费米子冷却
4. Characterization of Oxide Films on SiC Epitaxial (000-1) Faces by Angle-Resolved Photoemission Spectroscopy Measurements using Synchrotron Radiation [C] . Y. Hijikata, H.Yaguchi, S.Yoshida European Conference on Silicon Carbide and Related Materials . 2005

机译：SiC外延（000-1）面对角度分辨的光曝光光谱测量氧化膜的表征使用Synchrotron辐射测量
5. Laser-based Angle-resolved Photoemission Spectroscopy of Topological Insulators. [D] . Wang, Yihua. 2012

机译：拓扑绝缘子的基于激光的角分辨光发射光谱。
6. Probing spin correlations using angle-resolved photoemission in a coupled metallic/Mott insulator system [O] . V. Sunko, F. Mazzola, S. Kitamura, 2020

机译：在耦合金属/莫特绝缘子系统中使用角度分辨的光发射探测自旋相关性
7. Angle-resolved photoemission in doped charge-transfer Mott insulators [O] . Alexandrov A.S., Dent C.J. 1999

机译：掺杂电荷转移Mott绝缘子的角度分辨光发射

Current spinon-holon description of the one-dimensional charge-transfer insulator SrCuO2: Angle-resolved photoemission measurements

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